Success Stories
Statistical Analysis: We can provide you with a variety of statistical information on stored manufacturing test data. This includes pareto, regression, sampling, scatter plots, stratified frequency plots, histograms and other project-specific statistics.
Data Mining and Analysis: We can assist you in interpreting and finding the data you need to make important business decisions from non-centralized data sources.
Automated Statisical Reports for analysis of returned products, sampling and warranty information saved Quality Engineers hours of work and the company hundreds of thousands of dollars.
Custom and Automated Reporting: We can save your managers, engineers and technicians time and money by creating custom reports. We can automate report generation so that your employees can get reports automatically at specified intervals.
Physical Analysis: We provide expertise in a variety of surface and chemical analysis including: infrared spectroscopy, electron spectroscopy, photoelectron spectroscopy, reflectance measurements, bulk and surface scattering phenomena and more…
Analysis and modeling of reflectance data from Silicon wafers lead to the design of more accurate and competitive method to measure emissivity.